Measures Co-Planarity Of Connector Pins
The 2D CMOS Laser stably detects angled connector pins.
Measures Co-Planarity Of Connector Pins Read More »
The 2D CMOS Laser stably detects angled connector pins.
Measures Co-Planarity Of Connector Pins Read More »
This application uses a Line-beam Laser Photoelectric Sensor. ?This Line-beam Diffuse-reflective Laser Sensor is ideal for detecting the edges of transparent LCD substrates. You can install a Laser Photoelectric Sensor away from the workpieces.
Detects Transparent LCD Substrate Mapping Read More »
This application uses a Through-beam Fiber Sensor that is heat-resistant to 200°C.Install heat-resistant Through-beam Fiber Sensor with a convergent-reflective arrangement. This setting is hardly affected by the background, which enables precisely detecting the presence of LCD substrates.
Detect LCD Substrates In Oven Using Heat Resistant Fiber Read More »
This application uses a chemical-resistant Fiber Sensor that can be used in a chemical washing processes. This Fiber Sensor can detect passage of wafers in a chemical washing process. It uses fluororesin, which provides resistance to chemicals. And you can install it in a tight space because of the thin side-view design.
Detects Wafers In Chemical Washing Process Read More »
This application uses a Vacuum Fiber Sensor that can be used under a high vacuum. This Sensor can be used under a 10-5Pa vacuum. The Sensor has 1-channel and 4-channel flange system that you can combine according to the number of Sensors.
Detect Wafers In Vacuum Conveyor System Read More »
This space-saving sensor used under dry environments stably detects the bottoms of glass substrates while they are transferred on a conveyor.
Precisely Detects Transparent Glass Substrates Read More »
Multiple measurements can be made within the line beam, so the peaks of rivets can be measured from a reference surface with good stability.
Detects The Peaks Of Minute Rivets Read More »
This application uses a Side-view Fiber Sensor with a homogenous area beam. This Sensor uses a change in the amount of interrupted lights caused by notches and eccentricity to enable detecting the position of notches and eccentricity of wafers. The amount of interrupted light by wafers is proportional in the 11-mm-wide detection area. The special
Detects Notches And Eccentricity Of Wafers Read More »
Use the E5AR for cascade control. Input noise is mitigated.
Furnace Temperature Control Read More »
Space saving is possible with the 4-point input of the E5AR. NS direct connections are possible. High-speed control at the sampling rate of 50 ms is possible.
Space-saving and Easy Connection of Semiconductor Manufacturing Equipment Read More »